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pipelines for SDC workflows. Quantify SEI/CEI formation and evolution via CV/GCD/EIS/GITT/dQdV. Assist in operando/ in situ characterisation (e.g., FTIR, XRD, Raman) to correlate structure–property
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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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, electroanalytical techniques, atomic spectroscopy (FAAS, ICP-OES), DLS, XRD, SEM, etc. Languages: English, level equal to or higher than B1 Spanish: equal to or higher than B1. In case, the applicant does not have
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oxides, will be valued. Knowledge of SEM, XRD, XPS, AFM, DSC, and Raman and UV-Vis-NIR spectroscopy techniques will also be valued. Languages: English, level B1 or higher Other: The publication