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plasma-assisted CVD techniques; - Knowledge of characterization techniques: Raman spectroscopy, scanning electron microscopy, atomic force microscopy, X-ray diffraction, etc.; - Knowledge of vacuum
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, pressure, composition, atmosphere) influencing these mechanisms. 2. Characterization and Analysis Characterize the compounds formed at different stages of the process using advanced techniques: - XRD (X-ray
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deposition new types of ultra-thin magnetic films. The growth will be performed either by PLD or off-axis sputtering. structural characterizations including X-ray diffraction, reciprocal space mapping, AFM
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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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controlled atmosphere - master the usual characterisations of materials (X-ray diffraction, spectroscopies) - have knowledge of magnetism - fluency in English (oral and written comprehension and expression
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main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh Presses
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(XANES, EXAFS), X-ray microtomography, and 3D X-ray diffraction (s3DXRD). Candidates should submit a detailed CV, a cover letter, and a short one-page research proposal on the proposed topic online
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mechanical tests (hot tensile tests) ; - Knowledge of X-ray diffraction and the use of synchrotron beamlines, preferably at high energy ; - Fluency in oral and written English ; - Ability to process
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one of tha main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh
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diffraction spectrometer SAM. This position will be located at the Institut Laue-Langevin (Grenoble). - Integration with the SAM instrument team, in connection with the instrument manager and the technical