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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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controlled atmosphere - master the usual characterisations of materials (X-ray diffraction, spectroscopies) - have knowledge of magnetism - fluency in English (oral and written comprehension and expression
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main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh Presses
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materials. Strong knowledge of X-ray diffraction (XRD) and Rietveld refinement. Hands-on experience with electrochemical characterization techniques (CV, EIS, GITT, galvanostatic cycling). Deep understanding
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fluorescence (XRF), x-ray diffraction (XRD), scanning electron microscopy (SEM), and isotope geochemistry Conducting analyses using ICP-MS, ICP-OES, XRF and colorimetric techniques in consultation with
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ceramic materials by electrospinning for application in ceramic electrochemical reactors; use of different characterization techniques, including impedance spectroscopy, thermogravimetry, dilatometry, X-ray
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to neutron and X-ray scattering/diffraction experiments. You will also need to be competent with crystallographic diffraction data collection, data processing, solving & refining crystal structures using
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characterization techniques such as scanning electron microscopy (SEM, HRTEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and chemisorption techniques (TPD, TPR) is needed. Your contribution
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completed in a relevant field of study. Knowledge of x-ray/optical/electron physics, including diffraction, optics, detectors, scattering etc. Experience with deep learning (DL) libraries such as Tensorflow
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Materials Design. This environment will facilitate the development of new skills and the demonstration of creativity and leadership. Expertise in structure solution using powder and/or single crystal X-ray