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Field
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Summary The Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) Lab Manager is involved in all activity within the FIB-SEM facility at the Center for Advanced Material Characterization in Oregon (CAMCOR
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About The University of Texas at El Paso: The University of Texas at El Paso (UTEP) is a Carnegie R1, opportunity, and community engaged university at the heart of the U.S.-Mexico border region that is increasing access to excellent higher education. We advance discovery of public value and...
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specializing in Scanning Electron Microscopy (SEM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) to support advanced research in Earth materials. We are seeking an experienced professional with a
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3 Mar 2026 Job Information Organisation/Company Université de Lille Research Field Biological sciences » Biology Researcher Profile Recognised Researcher (R2) Leading Researcher (R4) First Stage Researcher (R1) Established Researcher (R3) Application Deadline 27 Apr 2026 - 22:00...
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). Primary emphasis is on the Thermo Fisher Helios 5UX DualBeam Focused Ion Beam (FIB), and/or Thermo Fisher Apreo Scanning Electron Microscope (SEM). Secondary emphasis on Transmission Electron Microscopy
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Microscope (S/TEM), Transmission Electron Microscope (TEM), Focused Ion Beam (FIB) System and their associated equipment; (e) provide technical support to staff and students for the operation of S/TEM, TEM
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beam scanning electron microscope (FIB SEM) with x-ray spectroscopy and cryo capability, an environmental SEM, and a transmission electron microscope. This project will involve development of novel
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to understand materials behaviour. Key Responsibilities: Conduct advanced characterization on thin films and nanostructure samples, especially FIB and TEM. Develop workflow for device fabrication. Develop
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for nanometric ion implantation based on laser ionization of neutral atoms coupled to a focused ion beam (FIB). The researcher will take part in the design, implementation, and performance characterization
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acquisition and processing challenges. Available instruments include several different focused ion beam scanning electron microscopes (FIB SEM), and x-ray energy dispersive spectrometers (XEDS) and