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Field
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provide improved techniques and/or methods. We work heavily with industrial and academic partners to improve these measurements. Crystallographic texture; Phase fraction; Electron backscatter diffraction
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Crystallographic investigation of novel materials using Neutron and X-ray diffraction and vibrational spectroscopy NIST only participates in the February and August reviews. Neutron and X-ray
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possess translational symmetry, the role of structure and symmetry in glasses is not established. This research programme involves the development of new x-ray and electron diffraction-based methods
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.B1995 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Hui Wu huiwu@nist.gov 301 975 2387 Description We develop and study new materials for carbon
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characterization techniques to determine processing-structure-property relations that occur during processing, including scanning and transmission electron microscopy, thermal analysis, and x-ray diffraction
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Dr Alireza Sadri) "Geometric-flow across diffraction patterns in 4D scanning transmission electron microscopy" (with Dr Timothy Petersen and Prof Michael Morgan) "Prospects for atomic-resolution
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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thermography to investigate material behavior under various loading conditions. Microstructural analysis will be conducted using advanced techniques such as scanning electron microscopy (SEM), electron
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Peterson). This project combines both theory and experiment. "Geometric-flow across diffraction patterns in 4D scanning transmission electron microscopy” (with Dr Scott Findlay and Dr Timothy Peterson