Sort by
Refine Your Search
-
Actinic Optical Dimensional Characterization of Deep-Subwavelength Nanostructures NIST only participates in the February and August reviews. This research opportunity centers on the development
-
Metrology for Quasi-Optical Wireless Probing of Monolithic Microwave Integrated Circuits NIST only participates in the February and August reviews. Ultrafast electronic devices with fundamental
-
NIST only participates in the February and August reviews. Electro-optic frequency combs provide tremendous flexibility and agility while being applicable to a wide range of present problems in
-
RAP opportunity at National Institute of Standards and Technology NIST Chip-Scale Nonlinear Optics Location Physical Measurement Laboratory, Applied Physics Division opportunity location
-
RAP opportunity at National Institute of Standards and Technology NIST Broadband Nanoimaging of Optically Excited Free Carriers Location Physical Measurement Laboratory, Applied Physics Division
-
RAP opportunity at National Institute of Standards and Technology NIST Femtosecond Time-resolved Optical Measurements in Condensed Matter Location Physical Measurement Laboratory, Nanoscale
-
RAP opportunity at National Institute of Standards and Technology NIST Carbon Nanotubes for Optical Applications - Directed Assembly, Characterization, and Emergent Properties Location Material
-
Integrated Photonic Interfaces to Free-space Volumes for Miniaturized Atomic and Molecular Optics Systems on a Chip NIST only participates in the February and August reviews. Postdoctoral research
-
301 975 3155 Description The project aims to develop nanoscale optical imaging microscopy using DUV and EUV light sources for accurate characterization of nanoscale structures that contributes
-
angela.hightwalker@nist.gov 301.975.2155 Description Dynamics in semiconductor materials will be studied using optical pump-probe methods. Rapid changes in optical properties of materials are measured using