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. The research includes experimental measurements on industrially-pertinent materials using a range of advanced methods (various modes of transmission electron microscopy, x-ray/neutron scattering, x-ray
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Bajcsy, PhD Information Technology Laboratory (ITL) National Institute of Standards and Technologies (NIST) Phone: 301-975-2958 Email: peter.bajcsy@nist.gov URL: https://www.nist.gov/people/peter-bajcsy
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preparation, manipulation, and electrical probing in conjunction with electron microscopy (SEM). Such probes not only have proven research utility, but are also used in industrial development and process
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