454 systems-science-"https:" "https:" "https:" "https:" "Stanford University" positions at NIST
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RAP opportunity at National Institute of Standards and Technology NIST Materials Discovery Using Synchrotron Radiation, Machine Learning, and Artifical Intelligence Location Material Measurement
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RAP opportunity at National Institute of Standards and Technology NIST High-pressure Nuclear Magnetic Resonance (NMR) Spectroscopy of Intermolecular Interactions Location Material Measurement
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the surfaces of metallic nanoparticles in an aqueous environment and with potential control (electrochemistry) is an extremely challenging problem at the forefront of computational chemistry. We are beginning to
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browsing capabilities. A small subset of project relevant publications is listed below. Requirements:A candidate should have at least a master’s degree in computer science or related fields (PhD is preferred
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of film behavior, and stimulus-responsive interfaces and (2) development of new bio- and nanometrology tools. In particular, we creatively harness microfluidic technology, basic microfabrication tools
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Electrochemical Surface Science of Metal-Electrolyte Interfaces: Theory and Experiment NIST only participates in the February and August reviews. Accurate models of the electrochemical interface
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Technology Laboratory (CTL) is seeking a Postdoctoral Fellow to develop new spectroscopy for intermolecular interactions. The team is pioneering an electric-acoustic spectrometer that selectively drives and
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NIST only participates in the February and August reviews. Additive manufacturing (AM) is a rapidly growing technology, but its commercial adaptation to ceramic-based materials lags behind
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RAP opportunity at National Institute of Standards and Technology NIST Nanoparticle Engineering, Production, Assembly, and Characterization Location Physical Measurement Laboratory, Nanoscale
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RAP opportunity at National Institute of Standards and Technology NIST Advances in High Resolution Mass Spectrometry for Exposure Sciences and Forensic Analyses Location Material Measurement