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Description Research opportunities are available to develop and advance measurement methods required for current and future semiconductor manufacturing processes. Areas of particular interest include
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8353 Christopher L. Soles christopher.soles@nist.gov 301.975.8087 Description To enable the use of novel materials in fiber reinforced composites, an unprecedented effort must be launched to develop
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measurements of these systems. Theory and simulations are being done to develop this understanding. We are investigating the electronic and optical properties of quantum dots and wires, metallic and
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NIST only participates in the February and August reviews. NIST has recently launched a program to develop high accuracy 3D thermal imaging and control using thermosensitive magnetic nano-objects
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to this research is the development and application of real-time data analysis pipelines to process the vast, high-speed XRD datasets generated during AM processes. These pipelines will utilize
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interest for us. Potential project areas include the design and development of systems that allow for careful control and measurement of the temperature and pressure of the sample; the development of peak
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on the development and application of high-resolution measurement methods to study fundamental problems with broad industrial impact in areas such as the service life prediction of polymeric materials. Recent projects
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properly integrating the various components. Measurement needs now being defined by the energy, homeland security, environmental, and health-care sectors are challenging sensor-science researchers to develop
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Michael Pettibone john.pettibone@nist.gov 301.975.5656 Description Detection, characterization and temporal evolution of metal nanoparticles is undergoing environmental transformations. Within
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the last 2 decades.[1] However, corresponding development of robust and reproducible in vitro assays for evaluating the critical quality attributes and/or the biological responses of these nano-enabled drug