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processing equipment is available for prototyping of specialized nanostructures. key words Nanotechnology; Quantum nanowires; Wide band-gap semiconductors; Metamaterials; Power electronics; Eligibility
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NIST only participates in the February and August reviews. Frequency combs are a powerful sensing tool capable of measuring broadband spectra with high resolution and high precision. The diffraction
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@nist.gov 303 497 5530 Nikolas Wilson Hrabe nik.hrabe@nist.gov 303.497.3424 Description Additive manufacturing (AM) is a transformational technology for fabricating complex metallic shapes directly from 3-D
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memory, batteries, catalysts, flexible devices, alternate computing paradigms, and quantum phenomena. In order to take advantage of the promising properties of these heterogeneous systems, holistic study
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of methane, ammonia, and nitrous oxide and DCS offers the ability to simultaneously measure multiple gases in a field environment. Not only is this indispensable for testing gas mitigation strategies, but
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Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope NIST only participates in the February and August reviews. Strain is induced when an electric field is
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. It is estimated that the majority (85%-99%) of genotypes detected in environmental samples represent microbial “dark matter” that cannot currently be cultured in modern microbiology laboratories
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Parratt kirsten.parratt@nist.gov 301 975 5046 Description The success of any antibiotic or antimicrobial approach rests in the developer’s ability to demonstrate it can effectively kill bacteria or severely
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integrated devices architectures, such as three-dimensional integrated circuits (3D-ICs), are poised to open up new avenues for more powerful functionally diverse electronics devices. Unfortunately, there is a
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microfluidic networks.Our goal is to develop systems that enable accurate, high-throughput, and dynamic measurement of materials in flow, which will, for example, improve the ability to specify composition and