453 systems-science-"https:" "https:" "https:" "https:" "Stanford University" positions at NIST
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RAP opportunity at National Institute of Standards and Technology NIST Nanoimprint Lithography Patterning of Functional Materials Location Material Measurement Laboratory, Materials Science and
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, and light-matter interactions. This research opportunity is focused on developing compact, integrated cavity optomechanical devices that push the state of the art in terms of sensitivity and accuracy
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NIST only participates in the February and August reviews. Many industrial processes generate carbon dioxide as a by-product, which is released to the atmosphere and contributes to global warming
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into therapeutic applications is design principles for predictably and reproducibly culturing cells and efficiently differentiating them into cell types of interest. Typical culture conditions today result in
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RAP opportunity at National Institute of Standards and Technology NIST Indoor Localization and Tracking Location Information Technology Laboratory, Advanced Network Technologies Division
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RAP opportunity at National Institute of Standards and Technology NIST Determination of Structural Ensembles Describing Conformational Averaging in Proteins and RNA from Solution NMR and X-ray
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NIST only participates in the February and August reviews. Knowledge of fluid thermophysical properties is vital for applications in industry, metrology, and environment. The tools of statistical
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RAP opportunity at National Institute of Standards and Technology NIST Long-Term Performance of Textiles, Nanocomposites, and High Strength Fibers Location Material Measurement Laboratory
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on these materials is analogous to that on synthetic quartz half a century ago, with much to be determined about crystal growth, defect evolution, and dependence on crystallographic orientation before high-performance
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RAP opportunity at National Institute of Standards and Technology NIST Development of Procedures for Increasing the Information Content of the Biomolecular Solution X-ray Scattering Data and