454 systems-science-"https:" "https:" "https:" "https:" "Stanford University" positions at NIST
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electron excited X-ray microanalysis has been the electron probe microanalyzer with wavelength dispersive spectrometer (EPMA/WDS). On the other hand, energy dispersive X-ray microanalysis is often viewed as
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RAP opportunity at National Institute of Standards and Technology NIST Microwave Conductivity of Carbon-Based Nanocomposites Location Material Measurement Laboratory, Materials Science and
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RAP opportunity at National Institute of Standards and Technology NIST Colloidal Phase Behavior of Carbon Nanotubes under High Concentrations of Polymers and Salts Location Material Measurement
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RAP opportunity at National Institute of Standards and Technology NIST Chip-Scale Nonlinear Optics Location Physical Measurement Laboratory, Applied Physics Division opportunity location
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RAP opportunity at National Institute of Standards and Technology NIST Block Copolymer Lithography Location Material Measurement Laboratory, Materials Science and Engineering Division
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RAP opportunity at National Institute of Standards and Technology NIST Discrete Photon Detection Location Physical Measurement Laboratory, Sensor Science Division opportunity location 50.68.51
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RAP opportunity at National Institute of Standards and Technology NIST Femtosecond Time-Resolved Measurements in Semiconductor Materials Location Physical Measurement Laboratory, Nanoscale
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to understand dynamic changes within microbiomes or to design interventions (e.g., modeling algal blooms, improving human health or crop yields, bioremediation). This project seeks is to develop measurement
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potentially competing performance goals. Achieving these goals requires the development and application of technologies, such as high performance building envelopes and advanced cooling and ventilating systems
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Sensor Science Division in Gaithersburg, MD. In Boulder, opportunities in JNT system research include ultra-low noise system design, SFQ electronics, electromagnetic interference (EMI) rejection/correction