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. The established uncertainty benchmark for absolute JNT is 12 ppm at the triple point of water (273.15 K), with more recent measurements achieving statistical uncertainties of 3 ppm. For temperatures in the range
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RAP opportunity at National Institute of Standards and Technology NIST Mathematical Modeling, Analysis, and Uncertainty Quantification Location Information Technology Laboratory, Applied and
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daniel.sunday@nist.gov 301 975 4921 Description Conventional optical-based photolithography is reaching the limits of scaling for the patterning and fabrication of nanoscale devices. The semiconductor industry
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and novel data-processing tools need to be developed to embrace these new techniques and further elevate their capabilities. Instrumentation available for this research includes ion trap, Orbitrap, and
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NIST only participates in the February and August reviews. The Alternative Computing Group at NIST has an ongoing program developing new metrologies to support emerging information processing
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NIST only participates in the February and August reviews. Accurate measurement of optical radiation is important for the optical communications, medical device, semiconductor lithography
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pushed the limits of mass detection to spectral resolutions over 100,000, allowing for specific mass determination and unknown compound identification. Analytical methods and novel data-processing tools
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Bergonzo christina.bergonzo@nist.gov (240)314 6333 John P. Marino john.marino@nist.gov 240.314.6361 Description There has been a recent emergence of RNA biotherapeutics; that is, small RNAs used as drug
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NIST only participates in the February and August reviews. Demand for mobile data, the implementation of new wireless devices, and an explosion of mobile users has stressed our telecommunications
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are particularly interested in developing and characterizing hybrid quantum systems (interfaces between dissimilar physical media), suitable for quantum information purposes, and exotic sources of faint light