413 associate-professor-computer-science-"https:"-"https:"-"https:"-"https:"-"NOVA.id" positions at NIST
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NIST only participates in the February and August reviews. With the advent of the silicon drift energy dispersive X-ray detector (SDD/EDS), enhanced opportunities for high precision and accuracy measurements have opened up[1]. Unfortunately though, few people are making full use of the...
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RAP opportunity at National Institute of Standards and Technology NIST Chemical Metrology of Dietary Supplements Location Material Measurement Laboratory, Chemical Sciences Division opportunity
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access to. Qualified candidates will have a background in electron microscopy or a relevant branch of computer science. key words Scanning transmission electron microscopy; Nanocharacterization; Electron
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at NIST and external collaborators, a successful candidate will extend our recently developed ML-driven autonomous systems for state assessment, calibration, and control of quantum information science
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RAP opportunity at National Institute of Standards and Technology NIST Integrated Quantum Nanophotonic Systems Location Physical Measurement Laboratory, Applied Physics Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Autonomous experimentation and machine learning of material properties Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Digital Twin of Breath Devices for Forensics and Health Metrology Location Material Measurement Laboratory, Applied
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, interfacial phenomena, and associated transduction processes, often at the nanoscale that allow detection. A wide variety of sensing principles (chemiresistive, capacitive, electrochemical, FET, mass loading
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RAP opportunity at National Institute of Standards and Technology NIST Complex Systems and Networks: Performance, Control, and Security Location Information Technology Laboratory, Applied and
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variables. Computer-controlled equipment is available for alternating-current magnetic-susceptibility measurements as a function of frequency, temperature, and magnetic field. An automated vibrating sample