412 computer-science-intern-"https:"-"https:"-"https:"-"https:"-"UCL" positions at NIST
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RAP opportunity at National Institute of Standards and Technology NIST Developing Novel Additive Manufacturing Processing Methods Location Material Measurement Laboratory, Materials Science and
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Lovestead TM, Bruno TJ: Analytical Chemistry 82(13): 5621-5627, 2010 Lovestead TM, Bruno TJ: Forensic Science International 204: 156-161, 2011 key words Cryoadsorption; Headspace; Analytical chemistry; Drugs
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NIST only participates in the February and August reviews. With the advent of the silicon drift energy dispersive X-ray detector (SDD/EDS), enhanced opportunities for high precision and accuracy measurements have opened up[1]. Unfortunately though, few people are making full use of the...
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RAP opportunity at National Institute of Standards and Technology NIST Generating Ontologies from Domain Corpora using Artificial Intelligence Techniques Location Information Technology
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RAP opportunity at National Institute of Standards and Technology NIST Models and Protocols for Accelerated Simulations of Molecular Interactions and Dynamics Location Information Technology
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RAP opportunity at National Institute of Standards and Technology NIST Chip-scale atomic magnetometers Location Physical Measurement Laboratory, Time and Frequency Division opportunity location
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RAP opportunity at National Institute of Standards and Technology NIST Incorporating Theory and Domain Knowledge into the Machine Learning of Polymeric Systems Location Material Measurement
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RAP opportunity at National Institute of Standards and Technology NIST Integrated Quantum Nanophotonic Systems Location Physical Measurement Laboratory, Applied Physics Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Metrology for Needed Nuclear Structure and Radioactive Decay Data Location Physical Measurement Laboratory, Radiation
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access to. Qualified candidates will have a background in electron microscopy or a relevant branch of computer science. key words Scanning transmission electron microscopy; Nanocharacterization; Electron