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to understand dynamic changes within microbiomes or to design interventions (e.g., modeling algal blooms, improving human health or crop yields, bioremediation). This project seeks is to develop measurement
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Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope NIST only participates in the February and August reviews. Strain is induced when an electric field is
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classification of scientific publications by their relevancy have been done at TRC. A successful applicant is expected to have a strong background in computer sciences, particularly in AI, NLP, and ML. No specific
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potentially competing performance goals. Achieving these goals requires the development and application of technologies, such as high performance building envelopes and advanced cooling and ventilating systems
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. This is especially critical for identifying new (potential) pathogens such as the outbreak of a novel E. coli strain O104:H4. However, this can be difficult using the existing platforms and software because
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. A key component of the project is high sensitivity magnetic scanning microscopy of these nano-objects, most likely using SQUID magnetometers. We are seeking a postdoc with background in scanning
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manufacturing of metal components through laser powder bed fusion have been increasingly embraced across a variety of industries and applications. But, broader adoption of this manufacturing technology—especially
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within the Quantum Measurement Division is investigating graphene metrology towards two goals: (1) to develop near-room-temperature graphene quantum Hall devices and other possible quantum electrical
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orientations in most engineering materials have some preferential distribution due to processing conditions and deformation history, referred to as crystallographic texture. This texture affects the initial
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NIST only participates in the February and August reviews. As of today, there is a plethora of cyber-physical instruments consisting of physical sensing (e.g., microscopy imaging) and cyber (digital