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effects on the performance of an integrated circuit (IC). 2. Identification of aging and/or performance signatures that can be extracted using non-invasive and non-destructive methods, such as imaging
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the technological hurdles at the interface of these disciplines to maximize device sensitivity and deliver a functional prototype, fully validated for transfer to industrial applications. You will be
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the use of advanced methodologies to evaluate nuclear size in our models of experimental evolution. This will then allow us to decipher how processes linked to this critical parameter, from modulation
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