Sort by
Refine Your Search
-
Category
-
Program
-
Field
-
force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and secondary ion mass spectrometry (SIMS). Electrical properties will be evaluated using Hall effect
-
or microscopy-based methods for analyzing material degradation (e.g. FTIR/Raman microscopy, SEM) Experience with grant writing, project management, or coordinating collaborative research Interest in
-
design and testing Cryogenic systems Optics, laser systems, and spectroscopy Microscopy Mechanical and electromagnetic isolation Bacterial or mammalian cell cultures Practical experience in
Enter an email to receive alerts for microscopy "https:" positions