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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
optimize the growth of GaAs nanowires integrating crystal-phase heterostructures by molecular beam epitaxy (MBE). Contribute to scientific writing, presentation of results, and promotion of the project's
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structures for single photon emitters, a key component of the future quantum technologies that will revolutionize society. He/she will develop nanostructures by molecular beam epitaxy (MBE) and will perform
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://nanomir.edu.umontpellier.fr/ ) is a world leader in GaSb-based mid-infrared (MIR) optoelectronic devices. The group specializes in the molecular beam epitaxy (MBE) growth of III-V semiconductors and operates 3 reactors, inc. a
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. Project N POLAR: context and objectives The N POLAR project aims at developing nitrogen-polarity III nitrides on silicon substrates by molecular beam epitaxy. The N-polarity III nitrides will be obtained by
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | about 1 month ago
engineering methods to fabricate advanced detector technologies and optical components. Research within the UV detector technology team has largely focused on the use of molecular beam epitaxy (MBE) for band
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tools, such as reactive sputtering, co-evaporation, or molecular beam epitaxy. Background developing and optimizing polycrystalline photoabsorber materials and interfacial/contact layers, including device
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with molecular beam epitaxy (MBE). Experience with magneto-optic Kerr effect (MOKE), Hall effect measurements, SQUID magnetometry, X-ray diffraction (XRD), AFM, or related characterization techniques
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growth experience in material growth using molecular beam epitaxy or metal organic chemical vapor deposition, semiconductor device fabrication will be given priority. Candidate who is interested in one
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techniques. Preferred Qualifications: Experience with molecular beam epitaxy (MBE). Experience with magneto-optic Kerr effect (MOKE), Hall effect measurements, SQUID magnetometry, X-ray diffraction (XRD), AFM