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electrical characterization of wide and ultra-wide bandgap semiconductor materials and devices, including GaN, Gallium Oxide, SiC and diamond (key enabling materials for power and RF electronics) and/or
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integrated research group, from semiconductor growth, materials analysis, device design, device fabrication and testing (electrical, reliability, thermal management) to packaging. A recent focus of our MOCVD
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new optical laser-based systems to study temperature as well as electric fields with sub-micron spatial resolution, as these limit device performance and reliability. In this context, new material and
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