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of dislocation stress fields (in collaboration with CEA Saclay). - Program the diffraction procedures to generate images comparable to Electron Channeling Contrast Imaging (ECCI) obtained using a Scanning Electron
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effects on the performance of an integrated circuit (IC). 2. Identification of aging and/or performance signatures that can be extracted using non-invasive and non-destructive methods, such as imaging
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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical
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for the direct spatio-temporal measurement of the turbulent dissipation rate at a solid wall. New post-processing algorithms are also developed for Particle Image Velocimetry to measure extremely dense 3D time