2 focused-ion-beam Postdoctoral positions at CNRS

Postdoctoral position (M/F) on atomic beam ionization for microscopy and spectroscopy using time- and position-sensitive detectors

CNRS | Orsay, le de France | France | 9 days ago

for nanometric ion implantation based on laser ionization of neutral atoms coupled to a focused ion beam (FIB). The researcher will take part in the design, implementation, and performance characterization

M/F Post-doc Étude des mécanismes de dégradation des composants de puissance grand-gap sous-jacents à leur fiabilité

CNRS | Toulouse, Midi Pyrenees | France | 3 months ago

Eligibility criteria - Knowledge of microelectronics technologies. - Experience working in clean room environments. - Experience using electron microscopy and optionally FIB (Focused Ion Beam). - Experience in