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modeling of x-ray spectroscopies sensitive to molecular chirality; simulations of x-ray–induced ultrafast electron-transfer, decay, and nuclear dynamics in gas- and liquid-phase systems; and the development
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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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The Materials Science Division (MSD) at Argonne National Laboratory is seeking highly motivated applicants for a postdoctoral appointee to join a multidisciplinary team developing next-generation tunable and narrow-bandwidth terahertz (THz) radiation sources and applying them to the study of...
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into APS beamlines and enabling transformative experiments in X-ray spectroscopy. This is an opportunity to contribute to a growing capability at one of the world’s premier synchrotron facilities
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agents for X-ray spectroscopy by integrating large language models (LLMs) with physics-aware spectroscopy workflows. The researcher will work closely with a multidisciplinary team of X-ray physicists and
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ultrafast nonlinear optical spectroscopy techniques—such as transient absorption and impulsive vibrational spectroscopy—the role aims to probe polariton-controlled electronic and nuclear dynamics occurring
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facilities, who are developing complementary microscopy and AI/ML workflows, ensuring that multimodal datasets (X-ray, electron microscopy, and spectroscopy) are well-aligned and interoperable. These positions
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planning) with commissioning-ready planning and early development of an XRS user program. The work will be carried out within the APS Spectroscopy Group (SPC) and will involve close collaboration with APS
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-ray measurements at Argonne’s Advanced Photon Source and complementary optical spectroscopy. The position offers a highly collaborative environment with experts in electronic materials and devices
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The Advanced Photon Source (APS) POLAR beamline is seeking a Postdoctoral Appointee to develop and employ advanced high-pressure instrumentation for x-ray spectroscopy and scattering techniques