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in process engineering, design of experiments, numerical simulation, thin film characterizations by a combination of structural, chemical and physical methods (XRD, Raman, IRTF, SIMS, XPS, Ellipsometry
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PhD student position on development of innovative bifunctional oxygen electrodes for SOC technology.
techniques employed will be XRD, SEM, TEM, Raman, etc… Category Researcher R.1.4 Contract duration 6 months Province Barcelona (IREC facilities) Procedure Applicants should send a detailed CV, a motivation
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materials characterization (e.g., UV-Vis-NIR, FTIR, XRD, SEM, AFM, Profilometer); Ability to work in a multidisciplinary team in an international environment and to work autonomously; Experience in providing
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(electron microscopy e.g. EPMA, SEM, and X-ray methods e.g. µCT, XRD) Preparing and evaluating solution analyses using ICP MS/OES Publishing and presenting research results at national and international
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, AFM, XRD, eCV, Hall, Nomarski, low- and room-temperature PL). Successful applicants will gain expertise in compound semiconductor epitaxy, advanced characterisation and will combine this with
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of materials by XRD, XPS, etc. • Optical and photovoltaic characterization Research FieldPhysics Additional Information Website for additional job details https://www.uni-goettingen.de/en/644546.html?filters
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at the 'Group of Smart Nanoengineered Materials, Nanomechanics and Nanomagnetism -Gnm3' (https://jsort-icrea.uab.cat/) of the Universitat Autònoma de Barcelona (UAB). The position is in the framework
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SD-26045-RESEARCHER IN ADVANCED PLASMA-ASSISTED DEPOSITION PROCESS DEVELOPMENT FOR CATALYTIC THIN...
in their decisions and businesses in their strategies. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you contribute? In the framework of a bilateral project
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Application deadline: 31/03/2026 Research theme: Nuclear Materials Hoe to apply: https://uom.link/pgr-apply-2425 UK only This 4-year PhD project is fully funded by the Nuclear Decommissioning
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fabrication. Receive individual trainings in state-of-the-art methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and transport measurements