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characterization techniques such as XRD, N2 adsorption, FESEM, TEM, XAS, XPS, dissolution-NMR, IR spectroscopy and TGA and other related spectroscopy techniques such as UV and fluorometer. Skilled in performing
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School graduates over a thousand students who are ready to take on great ambitions and challenges. For more details, please view: https://www.ntu.edu.sg/eee We are seeking to hire a Research Fellow to
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undergo comprehensive material characterization to assess layer quality through techniques such as high-resolution X-ray diffraction (HRXRD), X-ray photoelectron spectroscopy (XPS), ellipsometry, atomic
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but not limited XPS, ICP-OES, GC-MS, TEM. Experience with data visualization and analysis software. Background Investigation Statement: Prior to hiring, the final candidate(s) must successfully pass a
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spectroscopy (EIS). Experience with advanced structural and surface sensitive spectroscopic characterization such as Secondary Ion Mass Spectrometry, XPS, high resolution electron microscopy approaches and/or
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The ideal candidate will have in-depth knowledge of state-of-the-art characterizations techniques, including XPS Application ProcessEmpty heading Interested candidates should upload a detailed CV