Sort by
Refine Your Search
-
Listed
-
Country
-
Employer
- NIST
- Forschungszentrum Jülich
- ICN2
- Nature Careers
- University of Oregon
- Austin Community College District
- ETH Zurich
- Emory University
- Fraunhofer-Gesellschaft
- George Washington University
- Harvard University
- Hong Kong Polytechnic University
- King's College London;
- Michigan State University
- National University of Singapore
- SciLifeLab
- Technical University of Munich
- The University of Arizona
- Universitat Politècnica de Catalunya (UPC)- BarcelonaTECH
- University of Glasgow
- University of Manchester
- University of Sheffield
- University of Texas at El Paso
- University of Virginia
- University of Washington
- Université de Lille
- Utrecht University
- 17 more »
- « less
-
Field
-
Summary The Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) Lab Manager is involved in all activity within the FIB-SEM facility at the Center for Advanced Material Characterization in Oregon (CAMCOR
-
About The University of Texas at El Paso: The University of Texas at El Paso (UTEP) is a Carnegie R1, opportunity, and community engaged university at the heart of the U.S.-Mexico border region that is increasing access to excellent higher education. We advance discovery of public value and...
-
specializing in Scanning Electron Microscopy (SEM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) to support advanced research in Earth materials. We are seeking an experienced professional with a
-
3 Mar 2026 Job Information Organisation/Company Université de Lille Research Field Biological sciences » Biology Researcher Profile Recognised Researcher (R2) Leading Researcher (R4) First Stage Researcher (R1) Established Researcher (R3) Application Deadline 27 Apr 2026 - 22:00...
-
). Primary emphasis is on the Thermo Fisher Helios 5UX DualBeam Focused Ion Beam (FIB), and/or Thermo Fisher Apreo Scanning Electron Microscope (SEM). Secondary emphasis on Transmission Electron Microscopy
-
Microscope (S/TEM), Transmission Electron Microscope (TEM), Focused Ion Beam (FIB) System and their associated equipment; (e) provide technical support to staff and students for the operation of S/TEM, TEM
-
beam scanning electron microscope (FIB SEM) with x-ray spectroscopy and cryo capability, an environmental SEM, and a transmission electron microscope. This project will involve development of novel
-
acquisition and processing challenges. Available instruments include several different focused ion beam scanning electron microscopes (FIB SEM), and x-ray energy dispersive spectrometers (XEDS) and
-
including FIB, FESEM, aberration-corrected TEM, STEM, and a He-ion microscope. EDX, EELS, and thin-film XRD analysis capabilities are also available. The on-site facilities also include the availability
-
phase of the project, electron-transparent specimens will be prepared for TEM examination using plasma focused ion beam milling (FIB), followed by structural, compositional and electronic characterisation