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Bias-induced Strain Mapping of Electronic and Energy Materials in an Atomic Force Microscope NIST only participates in the February and August reviews. Strain is induced when an electric field is
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RAP opportunity at National Institute of Standards and Technology NIST CO2 Corrosion – Measurements for 21st Century Energy Infrastructure Location Material Measurement Laboratory, Applied
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RAP opportunity at National Institute of Standards and Technology NIST Mass Spectrometry Metrology to Enhance Nuclear Safeguards-related Particle Analysis Location Material Measurement
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RAP opportunity at National Institute of Standards and Technology NIST Modeling Metals Deformation at the Nanoscale Location Material Measurement Laboratory, Materials Science and Engineering
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RAP opportunity at National Institute of Standards and Technology NIST Measuring Cell Viability in Scaffolds Location Material Measurement Laboratory, Biosystems and Biomaterials Division
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RAP opportunity at National Institute of Standards and Technology NIST Experimental studies of quantum anomalous Hall effect devices Location Physical Measurement Laboratory, Nanoscale Device
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RAP opportunity at National Institute of Standards and Technology NIST Advanced computational modeling techniques to enable fast screening of RNA biopharmaceutical products Location Material
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RAP opportunity at National Institute of Standards and Technology NIST Benchmarking metaproteomic analytical workflows Location Material Measurement Laboratory, Chemical Sciences Division
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RAP opportunity at National Institute of Standards and Technology NIST Femtosecond Time-resolved Optical Measurements in Condensed Matter Location Physical Measurement Laboratory, Nanoscale
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. This is especially critical for identifying new (potential) pathogens such as the outbreak of a novel E. coli strain O104:H4. However, this can be difficult using the existing platforms and software because