Sort by
Refine Your Search
-
deposition new types of ultra-thin magnetic films. The growth will be performed either by PLD or off-axis sputtering. structural characterizations including X-ray diffraction, reciprocal space mapping, AFM
-
diffraction spectrometer SAM. This position will be located at the Institut Laue-Langevin (Grenoble). - Integration with the SAM instrument team, in connection with the instrument manager and the technical
-
(XANES, EXAFS), X-ray microtomography, and 3D X-ray diffraction (s3DXRD). Candidates should submit a detailed CV, a cover letter, and a short one-page research proposal on the proposed topic online
Searches related to diffraction
Enter an email to receive alerts for diffraction positions