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numerical results with observations from scanning and transmission electron microscopy provided by the partners of the ANR project IMP3D (https://anr.fr/Projet-ANR-24-CE08-3737 . - Select a discrete
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dynamics, it is therefore necessary to correct aberrations over time to restore a diffraction-limited illumination beam. This will be achieved using an adaptive optics (AO) loop specially designed for in
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diffraction and pair distribution function analysis, infrared spectroscopy, and µ-Raman spectroscopy. Chemical mapping and phase speciation will be evaluated by fluorescence and X-ray absorption spectroscopy
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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R&T. Where to apply Website https://emploi.cnrs.fr/Candidat/Offre/UPR3407-FABBEN-004/Candidater.aspx Requirements Research FieldEngineeringEducation LevelPhD or equivalent Research
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diffraction) for structural analysis. - ICP-MS for elemental composition. - SEM/EDX and TEM for morphology and element distribution. - TGA/DTA for thermal analysis and stability. - XPS for surface chemical
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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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has state-of-the-art scientific equipment, from synthesis to characterisation of molecular materials Where to apply Website https://emploi.cnrs.fr/Candidat/Offre/UMR5031-CORAME0-053/Candidater.aspx
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main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh Presses
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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical