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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical
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diffraction, and scanning electron microscopy, in the aim of the project “C2+toNH3 - Síntese eletroquímica sustentável de amoníaco via desidrogenação não oxidativa de biometano a etileno utilizando membranas
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hydrothermal methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld refinement for phase analysis. Electron microscopy (SEM, TEM, EDS) for morphology and elemental
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surface-emitting lasers with MHCG subwavelength diffraction grating mirrors): • Optimization by means of computer simulations of MHCG mirrors, • Finding the best strategies for efficient heat flow in
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subwavelength diffraction grating mirrors): Characterization of the devices at every stage of the project (LIV, emission spectra, near-field, far-field, small-signal modulation, etc.) Characterization
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one of tha main contributor to the In-situ X-ray diffraction experiments performed for studying the formation of new silicides using both large volume presses such as multi-anvil and Paris-Edinburgh
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radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge of image processing e.g. using machine learning German skills For further
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communication skills, as well as oral presentation skills Preferences Experience in synthetic inorganic chemistry. Characterization of paramagnetic compounds. Familiar with single-crystal X-ray diffraction and
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funding. Appointment Start Date: Fall 2025 Group or Departmental Website: https://hph.stanford.edu/careers (link is external) How to Submit Application Materials: Submit all application materials
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The Advanced Photon Source (APS) (https://www.aps.anl.gov/ ) at Argonne National Laboratory (Lemont, Illinois, US (near Chicago)) invites applicants for a postdoctoral position to develop and