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, such as DC and RF electron guns, as well as the design and handling of vacuum chambers. Prior exposure to free-electron-based instrumentation, such as scanning electron microscopes, transmission electron
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/cvr/facilities/scmi/, such as the JEOL CRYO ARM 300 electron microscope, Leica EM GP2, a cryo-FIB instrument with a Quorum transfer stage, and the Leica THUNDER Imager EM cryo-CLEM microscope
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to: Design, assemble, and align a single‑photon‑enabled scanning microscope; integrate detector modules, synchronization electronics, and time‑tagging workflows. Develop imaging protocols and benchmark
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at the atomic scale. The postdoctoral researcher will lead the theory component of a research program, developing microscopic models of impurity-host coupling and identifying optical signatures of correlated and
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to investigate cell–material interactions comprehensively. Practical experience operating advanced microscopy equipment, such as scanning electron microscopes (SEM) and confocal microscopes, to support detailed
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access to a microscopy and imaging facility with confocal and electron microscopes, flow cytometry, and BSL2 facilities. The department also maintains a greenhouse, vivarium facilities, field sites, and a
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, synchronization, and control electronics; establish measurement workflows, benchmark detection range, depth resolution, field of view, frame rate, robustness under background light; perform optical/system
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tomography (APT) and electron microscopes to develop the structure-property-processing relationship of materials. His research pursuits involve the development of advanced workflows to facilitate microscopic
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for Electron Microscopy and the Ramaciotti Centre for Cryo-EM that both house advanced scanning/transmission electron microscopes equipped with state-of-the-art electron detectors and a full suite of correlative
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learning, computer vision, and automated microscope control for autonomous imaging, focusing, and data acquisition. Advance AI-assisted image interpretation, including atomic structure recognition, defect