19 web-development-"https:" "https:" Fellowship research jobs at Johns Hopkins University
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: The Microsystems and Nanotechnology Division at the National Institute of Standards and Technology (NIST), Gaithersburg, MD is searching for postdoctoral researchers who are motivated to develop novel electronic
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NIST CHIPS R&D Metrology project that aims at developing measurement methodologies for the detection and identification of very low concentration of contaminants in liquid environments. The focus area
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preferred) to develop analytical tools needed to monitor and characterize micro and nanoplastic (MNP) particles. The applicant will use commercial optical photothermal infrared (OPTIR) microscopy and other
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for the semiconductor etching process. U.S. Citizen Preferred Key responsibilities will include but are not limited to: - Develop libraries of training data through mining of existing databases and simulation of infrared
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(-189°C) to Silver (961°C). As a member of our multi-disciplinary team, you will collaborate closely with experts in instrumentation, metrology, physics, and engineering to develop and enhance
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health sciences across the campuses of Johns Hopkins University to foster innovative, interdisciplinary scholarship and to train undergraduates, graduate students, and health professionals with skills
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electron spin resonance. For more information about the group, see: https://www.nist.gov/pml/nanoscale-device-characterization-division/nanoscale-processes-and-measurements-group/scanning . U.S. Citizen
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capabilities to aid in the predictive engineering of biological systems, such as proteins, as part of the NIST Engineering Biology Program. Develop artificial intelligence and machine learning analysis pipelines
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include but are not limited to: Conduct literature review and stakeholder engagement to Conduct literature review and stakeholder engagement to inform project development and identify gaps. Preparing
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thermoreflectance optical pump-probe thermal-property measurement methods, develop and refine instrumentation, optimize protocols, and provide thermal property data for thin-film and multilayer materials that can