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, morphological, chemical, and magnetic property characterization of permanent magnets (Nd-Fe-B) via TEM (EDS, EELS, HR(S)TEM, electron diffraction) and XPS. In situ TEM study (under heating and irradiation
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techniques: X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), N₂ adsorption/desorption, scanning and transmission electron microscopy (SEM/TEM), confocal microscopy, small-angle X-ray
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details, please visit our website at https://slst.shanghaitech.edu.cn/main.htm Shanghai Institute for Advanced Immunochemical Studies (SIAIS) Shanghai Institute for Advanced Immunochemical Studies (SIAIS
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laser/X-ray spectroscopy. Novel methods for characterizing, accessing, and manipulating amorphous materials and biological materials. Coherent diffraction imaging and its applications in free electron
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: ultraviolet-visible spectroscopy, X-ray diffraction, scanning and transmission electron microscopy. Photoelectrochemical techniques: scan voltammetry, chronoamperometry in the dark and under illumination