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crystals Perform materials characterization using Raman spectroscopy, Atomic Force Microscopy (AFM), X-ray diffraction (XRD), and scanning electron microscopy (SEM) to establish quality feedback loops
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are invited to apply for the position to conduct research on advanced computational algorithms for modelling of complex electromagnetic scattering and diffraction phenomena. The successful candidate will
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transmission electron microscopy (TEM), atomic force microscopy (AFM), and X-ray diffraction (XRD), etc. Prepare manuscripts, reports, and presentations for internal discussions and external publication
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and diffraction phenomena To develop an in-depth understanding of the underlying physics of electromagnetic scattering and diffraction from large and complex object in practical environment
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using scanning electron microscopes (SEM) and related techniques such as electron backscatter diffraction (EBSD), transmission Kikuchi diffraction (TKD), and electron channeling contrast imaging
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ICP RIE, and/or ion milling techniques. To analyse structural, electrical and optical characterisation results, e.g. scanning electron microscopy, X-ray diffraction, transmission electron microscopy