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topological characterization, well-posedness of PDE problems in domains with non-smooth and non-compact boundaries, global uniqueness, analysis and classification of singularities, asymptotic laws for diffusion
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strong-correlation systems by means of atomic resolution electron microscopy. We use various microscopy techniques, such as electron tomography, in-situ imaging under electric bias, differential phase
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30 Dec 2025 Job Information Organisation/Company National Institute for Materials Science Department Research Center for Electronic and Optical Materials Research Field Engineering Physics Chemistry
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