Sort by
Refine Your Search
-
Listed
-
Category
-
Program
-
Employer
-
Field
-
scanning probe microscopies, including atomic force microscopy (AFM), scanning electrochemical microscopy (SECM), and scanning electrochemical cell microscopy (SECCM) Systematic preparation and tip-based
-
, atomic force microscopy) may be employed as well. The research project aims at acquiring molecular level understanding of catalytic processes using innovative materials concepts. The range of experimental
-
Master Thesis in Physics or Materials Science: Remanent phase shifter based on memristive technology
techniques, including pulsed laser deposition (PLD), sputter deposition, electron-beam evaporation, optical lithography, and ion-beam etching. Characterization of individual layers using atomic force
-
to learn state-of-the-art lab methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and electrochemistry. Additionally, synchrotron
-
(„Christmas bonus“). The monthly salaries in euro can be found on the BMI website: https://go.fzj.de/bmi.tvoed.entgelt Further information on doctoral degrees at Forschungszentrum Jülich (including its
-
single filaments and single droplets to composite networks using techniques such as optical tweezers, fluorescence microscopy and atomic force microscopy. The concrete activities during the project will
-
cell has already achieved a record efficiency of 68.9%. (https://doi.org/10.1002/pssr.202100113) . The thin-film processing of such III-V devices is a crucial building block for maximum efficiency, as it
-
fabrication. Receive individual trainings in state-of-the-art methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and transport measurements
-
pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and transport measurements (Hall effect and magneto-transport at low temperature). For deeper insights
-
Department is developing and applying electron microscopy methodologies for nanoscale and atomic-resolution characterization of soft functional materials and their interfaces using a synergy of materials