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scanning probe microscopies, including atomic force microscopy (AFM), scanning electrochemical microscopy (SECM), and scanning electrochemical cell microscopy (SECCM) Systematic preparation and tip-based
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-filler composite fabrication Experience with at least several of the following techniques: SEM, SAXS, DLS, DSC, TGA, DMA, AFM, rheology, adhesion testing, FTIR, Raman, or comparable methods Evidence of
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, DLS, DSC, TGA, DMA, AFM, rheology, adhesion testing, FTIR, Raman, or comparable methods Evidence of scientific output (e.g., peer-reviewed publications, preprints, patents, software, industrial reports
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its employees in reconciling work and family life and regularly undergoes the audit berufundfamilie® . Further information at: http://www.ifw-dresden.de . The Nanostructured Thin Film Materials (NTFM