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in process engineering, design of experiments, numerical simulation, thin film characterizations by a combination of structural, chemical and physical methods (XRD, Raman, IRTF, SIMS, XPS, Ellipsometry
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participate at all the experimental steps required for obtaining giant optical nonlinearities. This procedure includes thin film deposition, annealing, X-Ray Diffraction studies (XRD), Scanning Electron
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