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PhD position: Nanoengineering refractory compositionally complex alloys for extreme conditions (M/F)
will be performed using transmission electron microscopy (TEM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS), providing access to atomic-scale structural and chemical information. Ion
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(ILL). The current ML models are optimized mainly for (monochromatic) X-ray reflectometry. We aim to generalize this approach to a wide range of samples and time-of-flight NR, coupled with automatic data
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