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contact and thus minimize friction and damage to the surfaces for improved energy efficiency [5,6]. To characterize these different polymer brushes, atomic force microscopy (AFM) is used, which in its
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/ Partnerships Partners of the PEPR DIADEM – CINEMA project funding this PhD: IRCER, Institut P’, ILM https://www.pepr-diadem.fr/projet/cinema-2/ Scientific Field and Context The optimization of growth–property
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Microscopy (SEM) studies and Atomic Force Microscopy (AFM) investigations. Bibliography: 1) M. Kowalczyk et al. Optical Materials Express 6, 2273-2282 (2016). 2) R.-N. Verrone et al. ACS Applied Nano Materials
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