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, the post-doc will perform experimental characterization of Low Frequency Noise (LFN) and Random Telegraph Noise (RTN) in FD-SOI components of ST Microelectronics, including critical extractions of parameters
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numerical results with observations from scanning and transmission electron microscopy provided by the partners of the ANR project IMP3D (https://anr.fr/Projet-ANR-24-CE08-3737 . - Select a discrete
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