Sort by
Refine Your Search
-
devices using broadband spectroscopy and electron microscopy The position offers a stimulating interdisciplinary environment and opportunities to develop advanced skills in numerical optimization
-
pathogens develop and interact with their host, in order to identify new potential targets for therapeutics. The institute is part of a campus that has state of the art facilities including microscopy, flow
-
will rely on advanced rheophysical, microscopy, and microfluidic techniques, as well as on the use of natural polymers derived from biomass (pectin, cellulose, hemicellulose), whose properties will be
-
the experimental development of an approach to the 3D characterization of organic crystals. The approach is based on thermo-microscopy, combined with multidirectional observation, allowing for in situ, 3D
-
the coagulation process - Expertise in fluorescence microscopy; proficiency in fluorescence video microscopy would be appreciated - Expertise in flow cytometry (in vivo immune cells) - Experience in
-
defended their PhD and have not yet undertaken a postdoctoral position are eligible. The candidate will carry out scanning tunneling microscopy (STM) experiments in a cryogenic and ultra-high-vacuum
-
homeostasis in different pathophysiological contexts. We will explore how MCSs modulate the organization of LBs and, in turn, how LB maturation influences MCS dynamics. Optical microscopy (widefield, confocal
-
crosslinking of the illuminated area: the LEPO's expertise in scanning probe microscopy (AFM, STM) combined with light excitations will be used to monitor the evolution of the assemblies formed under
-
Eligibility criteria - Knowledge of microelectronics technologies. - Experience working in clean room environments. - Experience using electron microscopy and optionally FIB (Focused Ion Beam). - Experience in
-
composition – The composition and chemical speciation of the films will be analyzed by X-ray photoelectron spectroscopy (XPS), complemented by scanning electron microscopy (SEM). Surface infrared measurements