Microscopic and Spectroscopic Characterization in Engineered Polymeric Materials

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Location: Gaithersburg, MARYLAND

Microscopic and Spectroscopic Characterization in Engineered Polymeric Materials

NIST only participates in the February and August reviews.


The purpose of this research is to develop advanced characterization techniques for physical and chemical properties in the complex engineered polymeric systems during their service lives in energy, infrastructure, and other applications. Both microscopic (atomic force microscopy, electric force microscopy, laser scanning confocal microscopy and scanning electron microscopy) and spectroscopic (infrared microscope, Raman microscope, fluorescence microscope, ultra-violet visible spectroscopy, x-ray photoelectron spectroscopy) tools and other relevant techniques are explored. We will focus on the microstructural changes and chemical degradation on surface, individual layers, or interfaces in multilayer systems containing polymers. Recent work includes characterization of failure mode and degradation mechanism of polymeric encapsulation materials in photovoltaic modules, light-emitting diode, and other energy-related areas.

Reference

Lin CC, Krommenhoek PJ, Watson SS, Gu X: “Depth profiling of degradation of multilayer photovoltaic backsheets after accelerated laboratory weathering: Cross-sectional Raman imaging”. Solar Energy Materials & Solar Cells 144: 289-299, 2016


Polymers; Atomic force microscopy; Scanning electron microscopy: Raman microscope; Infrared microscope; Degradation; Photovoltaic; Service life; Energy;



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