Researcher (M/F) : Development of fast and non-invasive methods to assess end-of-life electronic components
27 Feb 2026
Job Information
- Organisation/Company
CNRS- Department
Laboratoire des technologies de la microélectronique- Research Field
Engineering
Physics
Technology- Researcher Profile
Recognised Researcher (R2)- Application Deadline
19 Mar 2026 - 23:59 (UTC)- Country
France- Type of Contract
Temporary- Job Status
Full-time- Hours Per Week
35- Offer Starting Date
1 May 2026- Is the job funded through the EU Research Framework Programme?
Not funded by a EU programme- Is the Job related to staff position within a Research Infrastructure?
No
Offer Description
This research topic aims to develop non-invasive, non-destructive, fast, and suitable techniques for qualifying integrated electronic circuits at the end of their first life cycle, in order to facilitate their reuse.
1. Study of the main aging mechanisms and their effects on the performance of an integrated circuit (IC).
2. Identification of aging and/or performance signatures that can be extracted using non-invasive and non-destructive methods, such as imaging techniques, thermal mapping, power consumption analysis, electromagnetic emission patterns, etc. These measurements will be conducted in combination with an accelerated aging protocol.
3. Analysis of the trade-off between high-fidelity characterization, testing time, cost, and the potential risk of damage to the tested integrated circuit.
4. AI techniques can be used to extract meaningful signatures and predict the results of high-fidelity characterization (which may require slow and/or destructive measurements during direct testing) from a set of faster, simpler, and non-destructive low-fidelity measurements.
This work will be carried out at the Microelectronics Technology Laboratory (LTM), a joint research unit of the CNRS and the University of Grenoble Alpes (UGA) (UMR 5129) located on the CEA-LETI-MINATEC site in Grenoble. Around 100 people work at the LTM: 30 researchers or research professors, 18 engineers and technicians, 31 doctoral students, and 16 postdocs. The laboratory's activities are positioned at the frontier between upstream academic research and industrial research. Over the years, LTM has developed several direct partnerships with various players in the micro/nanoelectronics industry, notably STMicroelectronics in Crolles and Applied Materials in Santa Clara (USA).
This position is part of the Microelectronics LabEx at the University of Grenoble Alpes (UGA), a laboratory of excellence that brings together 12 laboratories (including one international) to address the technological, industrial, and environmental challenges of the next semiconductor revolution. Among other things, this project aims to develop innovative solutions in micro- and nanoelectronics, with a particular focus on sustainability and circular electronics.
The work will be associated with the chair of Prof. Jean-Pierre Raskin, internationally recognized for his research in advanced characterization of electronic components, system reliability, and non-invasive qualification methods. The candidate will contribute to the development of rapid, non-destructive characterization techniques for assessing the residual quality of electronic components and subsystems at the end of their life cycle, using cutting-edge technological platforms (nano-XRF imaging, aging test benches, X-ray microtomography, etc.).
Where to apply
- Website
- https://emploi.cnrs.fr/Candidat/Offre/UMR5129-MARCLO-108/Candidater.aspx
Requirements
- Research Field
- Engineering
- Education Level
- PhD or equivalent
- Research Field
- Physics
- Education Level
- PhD or equivalent
- Research Field
- Technology
- Education Level
- PhD or equivalent
- Languages
- FRENCH
- Level
- Basic
- Research Field
- Engineering
- Years of Research Experience
- 1 - 4
- Research Field
- Physics
- Years of Research Experience
- 1 - 4
- Research Field
- Technology
- Years of Research Experience
- 1 - 4
Additional Information
Eligibility criteria
Theoretical knowledge :
-Mastery of the principles of material and electronic component characterization (non-invasive methods, advanced imaging, thermal analysis, etc.).
-Knowledge of aging and degradation mechanisms in electronic systems (e.g., power amplifiers).
-Understanding of the challenges of circular electronics and qualification methods for component reuse.
Operational expertise::
-Experience in implementing accelerated aging tests and electrical measurements to assess component reliability.
-Ability to analyze and interpret experimental data (physical signatures, correlations with reliability).
-Use of artificial intelligence tools for data processing and identifying correlations between non-invasive signatures and electrical performance.
Interpersonal skills::
-Rigor and methodology in designing and applying complex experimental protocols.
-Creativity and innovation in developing qualification methods tailored to circular electronics.
-Collaborative mindset for working in multidisciplinary teams.
- Website for additional job details
https://emploi.cnrs.fr/Offres/CDD/UMR5129-MARCLO-108/Default.aspx
Work Location(s)
- Number of offers available
- 1
- Company/Institute
- Laboratoire des technologies de la microélectronique
- Country
- France
- City
- GRENOBLE
Contact
- City
GRENOBLE- Website
http://ltmlab.fr/
STATUS: EXPIRED
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