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of dislocation stress fields (in collaboration with CEA Saclay). - Program the diffraction procedures to generate images comparable to Electron Channeling Contrast Imaging (ECCI) obtained using a Scanning Electron
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effects on the performance of an integrated circuit (IC). 2. Identification of aging and/or performance signatures that can be extracted using non-invasive and non-destructive methods, such as imaging
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electrodes using various electron microscopy techniques (e.g. FIB-SEM); (ii) Reconstruction of the 3D structure through image analysis; (iii) Analysis of images from new and aged membrane-electrode assemblies
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protected and open field cultivation systems Use lab and field equipment (ICP, HPLC, gas exchange analyzer, soil/root/plant sensors, chlorophyll fluorescence, etc.), data loggers and image processing tools
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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical
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be monitored with an ensemble of 1D pressure sensors and event cameras in a Particle Image Velocimetry (PIV) setting, to record the changes of large-scale velocity flow field. Event-based vision is