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on the design and fabrication of prototype nanostructure electronic devices such as FinFETs for applications in high power electronics. We welcome proposals aimed at new technological aspects of semiconductor
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inertial navigation, medical imaging, and all-optical sensor networks. We are also interested in integrated cavity optomechanical devices that have sufficiently low optical and mechanical loss
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capabilities for characterizing nanoparticles at the single-particle level. There will also be opportunities for interested candidates to develop advanced data processing techniques. microscopy; light scattering
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laboratory is equipped with both a conventional atom probe tomograph as well as a prototype EUV-modified atom probe tool. Furthmore, our collaborative laboratory structure provides critical in-house support
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301.975.3507 Description Recent developments in Artificial Intelligence (AI) have allowed machine learning models to solve certain complex problems in natural language processing and other areas at large scales
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on incorporating novel, high-throughput forms of single particle EV detection schemes involving nano-flow cytometry, microfluidics, plasmonic or fluorescence imaging using nanoparticles, droplet digital PCR and/or
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the improvement of measurement science to reduce uncertainties associated with the power rating. Furthermore, as photovoltaic cells and modules age in the field under operation, various degradation
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are conducted throughout the manufacturing process of cell-based products and also serve as release criteria. Unfortunately, common measures of cell viability including dye-exclusion, often do not correlate
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NIST only participates in the February and August reviews. The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data
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preparation, manipulation, and electrical probing in conjunction with electron microscopy (SEM). Such probes not only have proven research utility, but are also used in industrial development and process