Sort by
Refine Your Search
-
of wiretap coding in highly directive links and to obtain new bounds for the finite-blocklength secrecy rate under a mutual information secrecy constraint. Context : Physical layer security techniques
-
new thermoelectric materials using data science and machine learning methods applied to materials, based on expert-reviewed experimental data from the literature and public databases (notably
-
opportunities for machine learning to address outstanding biological questions. The PhD (M/F), to be recruited in the context of the ERC StG MULTI-viewCELL, will be working on the development of a new method
-
species (organic radicals, transition-metal ions, etc.). Transient radical species can be trapped using nitroxides (spin trapping) or detected through the rapid-scan mode, which enables the acquisition
-
macroscopic hyperthermia. However, while the hotspot effect starts to focus attention, its experimental quantification without any modification of the nanoagent (luminescence reporter or destructive method) is
-
with Re/oxide systems. This subject involves the preparation (impregnation, precipitation, etc.) and advanced characterisation (IR, Raman, XAS, TEM, etc.) of metal/oxide catalysts for the synthesis
-
key elements to answer the question of the causes of changes in ozone trends throughout the troposphere. This will involve exploring regional and vertical differences to better understand the dominant
-
to populations and infrastructure. While heavy rainfall is well recognized as a triggering factor, recent studies have revealed the importance of snow cover and, in particular, rapid melting dynamics in
-
emulator of sea ice dynamics, trained using high-fidelity numerical simulations, (ii) variational data assimilation methods, and (iii) a simplified representation of physical processes in the atmospheric
-
in process engineering, design of experiments, numerical simulation, thin film characterizations by a combination of structural, chemical and physical methods (XRD, Raman, IRTF, SIMS, XPS, Ellipsometry