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traditional thin-film devices include exceptional structural quality, high surface-to-volume ratio, bottom-up device engineering with high-density on-chip integration, and utilization of quantum size effects
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RAP opportunity at National Institute of Standards and Technology NIST Cryptography Through the Lens of Quantum Information Science Location Information Technology Laboratory, Computer Security
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RAP opportunity at National Institute of Standards and Technology NIST Conductivity and Resistivity of Materials Location Physical Measurement Laboratory, Quantum Measurement Division
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RAP opportunity at National Institute of Standards and Technology NIST Chiral Assembly of Chromophores at Nanoscale Location Material Measurement Laboratory, Materials Science and Engineering
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RAP opportunity at National Institute of Standards and Technology NIST FEM simulations to characterize mechanical properties and deformation behavior in advanced packaging applications Location
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RAP opportunity at National Institute of Standards and Technology NIST Carbon Dioxide Capture, Storage and Utilization Location NIST Center for Neutron Research opportunity location 50.61.01
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RAP opportunity at National Institute of Standards and Technology NIST Interface Engineering: Using Surface Chemistry to Impart Desired Properties Location Physical Measurement Laboratory
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prediction. In collaboration with NASA, NOAA, and the USGS, NIST develops technology to advance the calibration and characterization of ground- and space-based infrared, optical, and temperature sensors
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RAP opportunity at National Institute of Standards and Technology NIST Femtosecond Time-resolved Optical Measurements in Condensed Matter Location Physical Measurement Laboratory, Nanoscale
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RAP opportunity at National Institute of Standards and Technology NIST Dielectric and Rheological Characterization of Chiral Cellulose Nanocrystal Polymer Composites Location Material