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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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of view (Raman spectroscopy, scanning electron microscopy, atomic force microscopy, etc.); - Participate in progress meetings and report writing. The work will be carried out at the Laboratory
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involving roughly the same number of scientists: New electronic states of matter; Physical phenomena at reduced dimensions; Soft matter and the physical-biological interface. In the first axis are grouped
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rely on the precise control and understanding of material, electronic and topological properties of 3DTIs. In this project, we propose to characterize the electronic properties of gated devices
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Research Framework Programme? Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure? No Offer Description As part of the “VERTIGO” electronics PEPR, which brings
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lie at the crossroads of multiple disciplines and involve expertise in optics, electronics, image and data processing (including machine learning), photophysics, chemistry and biology. The position is
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device fabrication techniques, including sputtering, evaporation, electron-beam lithography, optical and laser lithography, reactive-ion etching and plasma etching - Physical characterization techniques
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of surface acoustic waves coupled to a high mobility electron gas through the acoustoelectric effect, in view of developing non-linear integrated photonic-phononic circuits. We will use a well known material
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) the creation of new-based DNA nanostructures as a molecular template to hold proteins to facilitate molecular imaging by single-particle Cryo-Electron Microscopy (Cryo-EM) (2) the development of DNA-based nano
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Eligibility criteria - Knowledge of microelectronics technologies. - Experience working in clean room environments. - Experience using electron microscopy and optionally FIB (Focused Ion Beam). - Experience in