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, including X-Ray diffraction, scanning electron microscope, atomic force microscopy Additional comments NA Website for additional job details https://emploi.cnrs.fr/Offres/CDD/UMR137-JULGRO0-024/Default.aspx
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devices using broadband spectroscopy and electron microscopy The position offers a stimulating interdisciplinary environment and opportunities to develop advanced skills in numerical optimization
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the advanced imaging techniques available, including confocal microscopy for tracking fluorescent MPs and developmental analyses, as well as Scanning Electron Microscopy (SEM) available at the MNHN site. He/she
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Eligibility criteria - Knowledge of microelectronics technologies. - Experience working in clean room environments. - Experience using electron microscopy and optionally FIB (Focused Ion Beam). - Experience in
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crosslinking of the illuminated area: the LEPO's expertise in scanning probe microscopy (AFM, STM) combined with light excitations will be used to monitor the evolution of the assemblies formed under
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composition – The composition and chemical speciation of the films will be analyzed by X-ray photoelectron spectroscopy (XPS), complemented by scanning electron microscopy (SEM). Surface infrared measurements